Ku, Chin-Yu: search on Z-Library

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1

Postexposure Delay Effect on Linewidth Variation in Base Added Chemically Amplified Resist

Ku, Chin-Yu, Shieh, Jia-Min, Chiou, Tsann-Bim, Lin, Hwang-Kuen, Lei, Tan Fu

Journal:

Journal of The Electrochemical Society

Year:

2000

Language:

english

File:

PDF, 723 KB

english, 2000

2

Expanding the Process Window and Reducing the Optical Proximity Effect by Post-Exposure Delay

Ku, Chin-Yu, Shieh, Jia-Min, Chiou, Tsann-Bim, Lin, Hwang-Kuen, Lei, Tan Fu

Journal:

Journal of The Electrochemical Society

Year:

2001

Language:

english

File:

PDF, 719 KB

english, 2001

3

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Advances in Resist Technology and Processing XXI - Effect of PEB exhaust on resist CD for DUV process

Tsai, Shu-Fen, Sturtevant, John L., Chiu, Yuh-Shyang, Chien, Chih-Horng, Gao, Hann-Yii, Ku, Chin-Yu

Year:

2004

Language:

english

File:

PDF, 336 KB

english, 2004

4

Determination of the thermal expansion and thermo-optic coefficients of a bacteriorhodopsin film

Q Wang Song, Chunping Zhang, Chin-Yu Ku, Ming-Chieh Huang, Richard B Gross, Robert R Birge

Journal:

Optics Communications

Year:

1995

Language:

english

File:

PDF, 322 KB

english, 1995

5

[IEEE 2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2012.05.15-2012.05.17)] 2012 SEMI Advanced Semiconductor Manufacturing Conference - New method of WLCSP for process optimization and reliability prediction

Chin-Yu Ku,, Wei-Chi Huang,, Young-Chang Lien,, Ming-Chih Yew,, Po-Yao Lin,, Hsiu-Mei Yu,

Year:

2012

Language:

english

File:

PDF, 1.32 MB

english, 2012

6

Radiofrequency Catheter Ablation of Ventricular Arrhythmias Originating from the Continuum between the Aortic Sinus of Valsalva and the Left Ventricular Summit: Electrocardiographic Characteristics and Correlative Anatomy

Lin, Chin-Yu, Chung, Fa-Po, Lin, Yenn-Jiang, Chong, Eric, Chang, Shih-Lin, Lo, Li-Wei, Hu, Yu-Feng, Tuan, Ta-Chuan, Chao, Tze-Fan, Liao, Jo-Nan, Chang, Yao-Ting, Chen, Yun-Yu, Chen, Chun-Ku, Chiou, Ch

Journal:

Year:

2015

Language:

english

File:

PDF, 867 KB

english, 2015

7

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - New clear-out scheme to improve the overlay performance for a CMP process

Guo, Yao-Wen, Kao, Han-Pin, Chien, Tsung-Chih, Chang, Chiafu, Lin, Hsin-Sung, Chen, Yen-Fen, Ku, Chin-Yu, Herr, Daniel J. C.

Year:

2002

Language:

english

File:

PDF, 977 KB

english, 2002

8

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Process Control and Diagnostics - Real-time process control to prevent CD variation induced by postexposure delay

Ku, Chin-Yu, Lei, Tan F., Shieh, Jia-Min, Chiou, Tsann-Bim, Chen, Yung-Cheng, Miller, Michael L., Ashtiani, Kaihan A.

Year:

2000

Language:

english

File:

PDF, 189 KB

english, 2000

9

Ambient VOCs in residential areas near a large-scale petrochemical complex: Spatiotemporal variation, source apportionment and health risk

Hsu, Chin-Yu, Chiang, Hung-Che, Shie, Ruei-Hao, Ku, Chun-Hung, Lin, Tzu-Yu, Chen, Mu-Jean, Chen, Nai-Tzu, Chen, Yu-Cheng

Journal:

Environmental Pollution

Year:

2018

Language:

english

File:

PDF, 2.25 MB

english, 2018

10

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Process Control and Diagnostics - New overlay pattern design for real-time focus and tilt monitor

Ku, Chin-Yu, Lei, Tan F., Shieh, Jia-Min, Chiou, Tsann-Bim, Lin, Hwang-Kuen, Miller, Michael L., Ashtiani, Kaihan A.

Year:

2000

Language:

english

File:

PDF, 334 KB

english, 2000

11

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Advances in Resist Technology and Processing XIX - Method to improve the throughput and retain the CD performance for DUV process

Hsiao, Yung-Tsung, Liu, Ta-Chung, Chiu, Lee-Jean, Chen, Chih-You, Ku, Chin-Yu, Fedynyshyn, Theodore H.

Year:

2002

Language:

english

File:

PDF, 564 KB

english, 2002

12

Cartilage formation through alterations of amphiphilicity of poly(ethylene glycol)–poly(caprolactone) copolymer hydrogels

Ko, Chao-Yin, Yang, Chin-Yu, Yang, Shu-Rui, Ku, Kuan-Lin, Tsao, Chung-Kan, Chwei-Chin Chuang, David, Chu, I-Ming, Cheng, Ming-Huei

Journal:

Year:

2013

Language:

english

File:

PDF, 1.31 MB

english, 2013

13

Modified critical angle method for measuring the refractive index of bio-optical materials and its application to bacteriorhodopsin

Song, Q. Wang, Ku, Chin-Yu, Zhang, Chunping, Michalak, Richard

Journal:

Journal of the Optical Society of America B

Year:

1995

Language:

english

File:

PDF, 1.26 MB

english, 1995

14

Design and synthesis of new 2-arylnaphthyridin-4-ones as potent antitumor agents targeting tumorigenic cell lines

Liu, Chin-Yu, Cheng, Yung-Yi, Chang, Ling-Chu, Huang, Li-Jiau, Chou, Li-Chen, Huang, Chi-Hung, Tsai, Meng-Tung, Liao, Chih-Chang, Hsu, Mei-Hua, Lin, Hui-Yi, Wu, Tian-Shung, Wen, Yen-Fang, Zhao, Yu, Ku

Journal:

European Journal of Medicinal Chemistry

Year:

2015

Language:

english

File:

PDF, 1.65 MB

english, 2015

15

Focus Measurement with a Simple Pattern Design

Ku, Chin-Yu, Lei, Tan Fu, Lin, Hwang-Kuen

Journal:

Year:

2001

Language:

english

File:

PDF, 1.40 MB

english, 2001

16

Determination of the refractive index of a bacteriorhodopsin film

Zhang, Chunping, Song, Q. Wang, Ku, Chin-Yu, Gross, Richard B., Birge, Robert R.

Journal:

Year:

1994

Language:

english

File:

PDF, 379 KB

english, 1994

17

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Advances in Resist Technology and Processing XX - Post soft-bake delay effect on CD variation in DUV resist

Tsai, Shu-Fen, Chen, Chih-You, Chan, King-Terk, Gao, Hann-Yii, Ku, Chin-Yu, Fedynyshyn, Theodore H.

Year:

2003

Language:

english

File:

PDF, 332 KB

english, 2003

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